报告题目：Electron Driven in Situ Transmission Electron Microscopy of Nanostructures
报 告 人：Prof. Mark H. Rummeli
Modern aberration corrected transmission electron microscopes (TEM) offer new insight into nanomaterials. This is because many materials are highly electron beam sensitive to the electron acceleration voltages typically used in uncorrected systems (e.g. 300 or 200 kV). The introduction of aberration correction allows one to work at reduced voltages where damage is often significantly reduced while still allowing near atomic or atomic resolution. None-the-less, despite the reduction in electron-beam sample interactions, they do still exist and can be usefully exploited to drive reactions inside a TEM. In this talk a variety of in situ reactions driven by the electrons from the imaging beam are presented for a variety of nanomaterials. It is also possible, with the use of a specialized sample holder, to drive electrons through a specimen (e.g. an electrical current). Dynamic reactions can also occur under electrical bias which can also be captured and investigated in situ. Various bias driven reactions are also presented.
In summary, these exciting studies show only a small part of the tremendous potential of in situ TEM to both characterize and study nanomaterials in a broader sense.
个人简介：Mark H. Rummeli earned his PhD from London Metropolitan University. He then worked as a Research Fellow at the German Aerospace Center (DLR) at the Institute of Space Sensor Technology and Planetary Exploration on the development of THz lasers as part of a joint DLR/NASA project (SOFIA). He currently heads the Molecular Nanostructures group at the Leibniz Institute for Solid State and Materials Research Dresden. He also heads the nanostructure analysis unit at the center for integrated nanostructure physics, an Institute for Basic Science (IBS) in South Korea. He is also a full professor at the department of energy sciences at Sungkyunkwan University (South Korea). His research interests include understanding nano-structures, as well as advanced techniques for their characterization.